Mantis 5000 Spécifications

Diffuse Reflectance Accessory (Internal) Note: This document is also available in PDF formatfor improved print quality. PDF files are stored in the &

Figure 8: Position 'D' measures diffuse reflectance only. Position 'S' measures total reflectance by including the specular compon

UV/VIS R928 PMT R928 PMT R928 PMT Detectors NIR TE# cooled InGaAs TE# cooled PbS Sphere diameter 110 mm Internal coating Polytetra

Figure 10. The internal DRA. Note the clips on the left hand side of the accessory. These are for attaching metal screens during reference beam attenu

1 Sample mount ledge Permits mounting of 1” and 2” samples in %T and %R modes 08 101697 00 The Standard Sample Holder Kit will accommodate mounting of

Figure 11: The Cary 4000, 5000 and 6000i Internal Diffuse Reflectance accessory with the optics cover removed. The large reference plate is clamped o

1. Click the Windows Start button, then Programs, then Cary WinUV, and then Align. 2. Click the Cary tab. 3. Set the following parameters: Double

10. Adjust the vertical alignment of the beam on mirror M2 by adjusting the hexagonal screw at the front of mirror M1. 11. Check that the light is not

Figure 12: Simplified beam diagram of the accessory with the sphere cap in the 'D' position. The specular component is reflected back out o

Figure 13: Simplified beam diagram of the accessory with the sphere cap in the 'S' position 7. Carefully remove the m ask from the diffus

Figure 14: DRA socket 10. Place the PTFE reference disc over the reflectance port. 11. Install the Extended Sample Compartment according to its inst

o NIR reflectance measurements (Cary 5000 only) o Specular-only reflectance measurements • Measurement calibration and corrections • Maintenance •

Correction None Autostore tab File Storage: Storage OFF 4. Click the 'Goto' button to open the 'Goto wavelength' dialog box. E

Installing attachments Attachments can be installed into the DRA to increase its flexibility and versatility. The following are optional attachments:

You must first install the liquid sample holder. 1. Place the protruding reference plate in position in the reflectance port, and position the cuvett

The small sample holder is used to measure reflectance of small samples. The powder cell can be mounted in the small sample holder to enable the refle

Figure 20. Insert the powder cell into the small sample holder. 8. Tighten the screw on the small sample holder to secure the powder cell. Figure 2

Installing the small sample mount The small sample mount enables you to take reflectance readings of very small solid samples, for example gemstones.

Figrue 23. The mask and sample are placed on the sample cup. Note The sample mounts have V-shaped cutouts that enable small samples to assist in the

Figure 24. The small sample mount fits into the small sample holder. Note that in this picture the small sample holder and small sample mount are in

Figure 25. The PTFE standard fits into the sample cup. b) Fit the aperture onto the sample cup. c) Place the sample cup over the reflectance or

Figure 26. The polarizer installed on the polarizer mount. You can install the Polarizer/Depolarizer into the DRA to control the plane polarization o

Figure 1: The two components of reflection: specular and diffuse reflection. n represents the surface normal, an imaginary line at 90° to the sample

Figure 27. The Double Aperture attachment. A indicates the locating pin at the bottom of the attachment. 1. Turn on the instrument and allow it to w

Figure 29. The mask fits onto the double aperture base. This figure shows only one aperture is open. 7. Click the Windows Start button, then Program

14. Adjust the height adjustment screw on the side of the polarizer mount until the transmission reading is half (+/- 1%) of the reading noted in step

that the instrument to be turned on and off at various times. It is important to take care that you follow these steps as failure to do so can cause d

8. Click the Setup button. 9. From the Setup menu, set the following parameters: Cary tab X mode: Mode Nanometers X mode: Start 700 X mode: Stop 4

Figure 16. The sample mount ledge. 13. Click the Start button. The Save As dialog box will appear, allowing the method to be saved as either a data

1. Click the Windows Start button, then Programs then Cary WinUV and then Scan. 2. Click the Setup button. 3. Set the following parameters: Cary ta

4. Click the Goto button to open the 'Goto wavelength' dialog box. Enter '801' in the wavelength field and click OK. The instrumen

X mode: Stop 300 Y mode: Mode % R Y mode: Y min -5.00 Y mode: Y max 110.00 Scan controls: Ave time (s) 0.100 Scan controls: Data interval (nm) 1.

12. From the Maths dialog box choose Selected Trace and then the '=' (equals) sign. 13. The results of this specular data equation will be d

Integrating spheres measure reflectance and transmittance factors, commonly called reflectance and transmittance. The relative spectral reflectance (t

3. Click the Baseline button in the Scan dialog box. Follow the on-screen prompts to perform a 100%T baseline scan and a 0%T baseline scan. Hot Tip W

Caution Both instrument and DRA are calibrated at the factory and should be recalibrated only when tests indicate the need for it. When should I perf

This option causes the Cary system to use the deuterium lamp to calibrate the instrument at 2624.4, 1312.2 and 0.00 nm. Note When performing a wavele

This allows the user to view the Wavelength offsets stored in the EEPROM. Performing a correction to ASTM E903-C-OS/2 If you are using a NIST Standar

Baseline tab Correction Zero x std ref correction Autostore tab File Storage: Storage Storage on (prompt at start) Place the reference disk or S

You may gently flush the accessory with pure nitrogen to remove water by using the N2 connector lines at the back of the instrument. Keep the referen

• Black ceramic tile • Colored tiles • Aluminium mirrors • Absorbing glass NPL also have transmittance standards of neutral glass filters with

Cannot select the required wavelength Check that the wavelength ranges of instrument and DRA are compatible. Refer to the Specifications table. Spare

375 0.991 1450 0.992 2130 0.964 2380 0.991 1500 0.992 2140 0.964 2390 0.992 1550 0.992 2150 0.965 2400 0.993 1600 0.992 2160 0.967 2450 0.993 1650 0.9

2. Zwinkels J., Dodd C.X.: Workshop on Optical Property Measurement Techniques, Commission of the European Communities. (1988). 3. Weidner V.R., Hs

Figure 2: Collection of scattered light by an integrating sphere. Io = incident light, Is = scattered light. In order to perform useful measurements

Some of the reflected light escapes through the ports. This has the effect of reducing the signal to noise ratio, and thus the precision of the measur

Figure 4: Some of the wide-angle reflection is intercepted by the sphere wall The edges of the reflectance port are feathered to reduce this error.

Surface type Reflectivity Reference Matt High PTFE reference plate Matt Low Labsphere diffuse reflectance standards Glossy High Protruding PTFE

Optical design Figure 7: The optical design of the DRA 1. The sample beam hits mirror M1 and is then reflected to M2. 2. The beam travels through